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Rauheitsmessgerät W40 mit 2µm Taster und Software

Rauheitsmessgerät W40 mit 2µm Taster und Software

Rauheitsmessgerät W40 mit 2µm Taster und Software
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Item no: 1033927 101 

Online price:

Available in 11-13 working days.

Application
Surface measuring device with free scanning and automatic zero positioning for precise and standardised roughness and waviness measurements.

Execution
  • All R-, P and W-profiles can be measured precisely
  • Manual feed with integrated start button for one-handed operation
  • Motorised probe lowering for automatic positioning and raising after measurement
  • Measure in any position and at any angle, including overhead
  • Flexible programme design and logging
  • Export characteristic values and profiles, optional statistic interfaces
  • Includes measurement and evaluation software Evovis Mobile Standard
  • Probe connection: TK probe (6-pin), measuring range +/-300 µm, resolution 1 nm, probe lowering 4 mm
  • Guide precision 0.2 µm/20 mm, measuring speed 0.2-2 mm/s, positioning accuracy 0.2-3 mm/s

Advantage
  • With Evovis mobile software, supports the 'latest' roughness standard ISO 21920 (in scope of delivery)
  • Supports reference surface probes and skidded tracers
  • Wide range of probes

Delivery
1x Waveline Xmove20 feed unit
1x Waveline Evovis Mobile Standard software
1x TKU 300/600 probe
1x TS1 KE2/90 T1.9D D4/30 probe
Power adapter, cable
Tool set
Storage case


Brand: HOMMEL ETAMIC
Type: Waveline W40 mit 2µm Tastspitze
Probe system: Free probe system
Sensor tip: 2 µm
Parameters: A1 | A2 | AR | AW MOTIF) | MR1 | MR2 | NR (MOTIF) | NW (MOTIF) | Pa | Pdc | Pmr | Ppc | Pq | Pt | Pz | R | Ra | Rc | Rdc | Rdg | RdL | Rdq | Rk | Rmax | Rmr | Rp | Rp (ASME) | Rpc | Rpk | Rq | Rsk | Rsm | Rt | Rv | Rvk | Rx | Rz | Rz (JIS) | W | Wa | Wq | WSk | WSm | Wt | Wte (MOTIF) | Wx (MOTIF)
Sensor tip angle: 90 Degree
Data transmission type: Cable

Manufacturer part no.: 721200

Product Datasheet
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